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| SCMSAMPLE-CP |
| Scanning Capacitance Sample, mounted on 18mm Puck for Innova/CP-II. Th |
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| SD-101 |
| SPM sample mounting disks, steel, 12mm diameter |
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| SD-102 |
| SPM sample mounting disks, steel, 15mm diameter |
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| SD-103 |
| SPM cross-sectional sample holder for all Veeco SPMs. This cross-secti |
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| SD-104 |
| SPM sample mounting disks, 6mm diameter |
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| SHS-200 |
| Calibration artifact: step height standard, on 12mm puck. This calibra |
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| SHSPT-200 |
| Calibration artifact: grating step height standard, Pt coated, on 12mm |
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| STR10-1000P |
| Calibration artifact: 100nm step height, 10µm pitch. This VLSI Su |
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| STR10-1800P |
| Calibration artifact: 180nm step height, 10µm pitch. This VLSI Su |
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| STR10-180P |
| Calibration artifact: 18nm step height, 10µm pitch. This VLSI Sur |
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| STR10-440P |
| Calibration artifact: 44nm step height, 10µm pitch. This VLSI Sur |
|
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| STR3-1000P |
| Calibration artifact: 100nm step height, 3µm pitch. This VLSI Sur |
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| STR3-1800P |
| Calibration artifact: 180nm step height, 3µm pitch. This VLSI Sur |
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| STR3-180P |
| Calibration artifact: 18nm step height, 3µm pitch. This VLSI Surf |
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| STR3-440P |
| Calibration artifact: 44nm step height, 3µm pitch. This VLSI Surf |
|
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| STS2-1000S |
| Calibration artifact: 100nm step height, 1.8/3/5µm pitch, NIST tr |
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| STS2-1800S |
| Calibration artifact: 180nm step height, 1.8/3/5µm pitch, NIST tr |
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| STS2-180P |
| Calibration artifact: 18nm step height, 1.8/3/5µm pitch, NIST tra |
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| STS2-440P |
| Calibration artifact: 44nm step height, 1.8/3/5µm pitch, NIST tra |
|
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| STS3-1000P |
| Calibration artifact: 100nm step height, 3/10/20µm pitch, NIST tr |
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